Global Finance News
06 Oct 2026, 09:04
Keysight Technologies (NYSE: KEYS) has partnered with the University of Glasgow, the UK’s National Physical Laboratory and MPI Corporation to develop a new broadband testing method for next-generation semiconductor devices.
The collaboration demonstrated continuous on-wafer characterization of indium phosphide high-electron-mobility transistors, or InP HEMTs, from near DC to 250 GHz in a single sweep. The approach uses Keysight’s PNA-X Vector Network Analyzer, 250 GHz Frequency Extender and Precision Source/Measure Unit alongside MPI probing technology and NPL calibration expertise.
The new methodology allows engineers to collect consistent broadband S-parameter measurements with a single probe touchdown, reducing the need for multiple measurement setups and calibrations.
Keysight said the approach could simplify characterization of semiconductor devices designed for millimeter-wave and sub-terahertz applications, helping researchers generate more consistent data and accelerate development of technologies used in areas such as advanced communications and high-frequency electronics.
The collaboration demonstrated continuous on-wafer characterization of indium phosphide high-electron-mobility transistors, or InP HEMTs, from near DC to 250 GHz in a single sweep. The approach uses Keysight’s PNA-X Vector Network Analyzer, 250 GHz Frequency Extender and Precision Source/Measure Unit alongside MPI probing technology and NPL calibration expertise.
The new methodology allows engineers to collect consistent broadband S-parameter measurements with a single probe touchdown, reducing the need for multiple measurement setups and calibrations.
Keysight said the approach could simplify characterization of semiconductor devices designed for millimeter-wave and sub-terahertz applications, helping researchers generate more consistent data and accelerate development of technologies used in areas such as advanced communications and high-frequency electronics.
